본문 바로가기
대메뉴 바로가기
National Nanofab Center
Ministry of Science and ICT
KAIST
EMS
KR
검색어
열림버튼
통합검색
검색어를 입력해주세요
검색
전체메뉴
전체메뉴
Service
Service
National Nanofab Center
Fab Service for overseas user
Processing service
Nano·Semiconductor Processing
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Nanomaterials
Batch process
Analysis and Evaluation service
Introduction
Structural analysis
Surface/Composition analysis
Product analysis
Education service
Introduction
Training schedule
Equipment and contact
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Structural analysis
Surface/Component analysis
Product analysis
Nanomaterials
Bioanalysis
Device analysis
Usage procedures and fees
Usage procedure
FAB access guide
Usage fee
Payment of usage fee
Platform technical support
Platform technical support
National Nanofab Center
Semiconductor integrated process platform
0.18㎛ Technology
0.13㎛ Technology
Intelligent semiconductor
Nano-Bio platform
Microfluidic device·chip
MEMS in vitro diagnostic biosensor
Healthcare device
USB (User Switchable Biosensor) packaging
Next-generation sensor manufacturing platform
Thick MEMS
Thin MEMS
WLP
Material development platform
Semiconductor materials
Solid-state battery
Advanced packaging materials
Nano semiconductor convergence device platform
Display
Quantum sensor
Silicon Photonics
Technical support procedures/methods
Information
Information
National Nanofab Center
PR Center
NNFC Movies
NNFC Brochure
About NNFC
About NNFC
National Nanofab Center
Greetings
Introduction
Overview
Infrastructure
History
Organization
Organization chart
Member
Directions
Service
Fab Service for overseas user
Processing service
Nano·Semiconductor Processing
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Nanomaterials
Batch process
Analysis and Evaluation service
Introduction
Structural analysis
Surface/Composition analysis
Product analysis
Education service
Introduction
Training schedule
Equipment and contact
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Structural analysis
Surface/Component analysis
Product analysis
Nanomaterials
Bioanalysis
Device analysis
Usage procedures and fees
Usage procedure
FAB access guide
Usage fee
Payment of usage fee
Platform technical support
Semiconductor integrated process platform
0.18㎛ Technology
0.13㎛ Technology
Intelligent semiconductor
Nano-Bio platform
Microfluidic device·chip
MEMS in vitro diagnostic biosensor
Healthcare device
USB (User Switchable Biosensor) packaging
Next-generation sensor manufacturing platform
Thick MEMS
Thin MEMS
WLP
Material development platform
Semiconductor materials
Solid-state battery
Advanced packaging materials
Nano semiconductor convergence device platform
Display
Quantum sensor
Silicon Photonics
Technical support procedures/methods
Information
PR Center
NNFC Movies
NNFC Brochure
About NNFC
Greetings
Introduction
Overview
Infrastructure
History
Organization
Organization chart
Member
Directions
닫기
national nanofab center
Service
HOME
Service
Service
Platform technical support
Information
About NNFC
Homepage Guide
Equipment and contact
Fab Service for overseas user
Processing service
Analysis and Evaluation service
Education service
Equipment and contact
Usage procedures and fees
Structural analysis
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Structural analysis
Surface/Component analysis
Product analysis
Nanomaterials
Bioanalysis
Device analysis
SNS공유
닫기
페이스북
트위터
블로그
복사하기
프린트
Structural analysis
Home
Service
Equipment and contact
Structural analysis
SNS공유
닫기
페이스북
트위터
블로그
네이버 밴드
카카오스토리
카카오톡
복사하기
프린트
ALL
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Structural analysis
Surface/Component analysis
Product analysis
Nanomaterials
Bioanalysis
Device analysis
게시물 검색
ALL
게시물 검색
Total
15
(Page
1
/2)
Structural analysis
Desktop Scanning Electron Microscope
Maker
Thermo Fisher Scientific
Model
Phenom Pro G6
Id
MSE70
View
Structural analysis
Bio - Scanning Electron Microscope
Maker
TESCAN
Model
MAGNA GMU
Id
MSE60
View
Structural analysis
Field Emission Scanning Electron Microscope
Maker
HITACHI
Model
S-4800 (2)
Id
MSE50
View
Structural analysis
Ultra-high Resolution Field Emission Scanning Electron Microscope
Maker
HITACHI
Model
SU8230
Id
MSE40
View
Structural analysis
Field Emission Scanning Electron Microscope
Maker
HITACHI
Model
S-4800 (1)
Id
MSE30
View
Structural analysis
Field Emission Scanning Electron Microscope
Maker
FEI
Model
Sirion
Id
MSE10
View
Structural analysis
Precision Etching & Coating System (PECS)
Maker
Gatan
Model
PIPS 691
Id
MTS 11
View
Structural analysis
Field Emission Transmission Electron Microscopy
Maker
Jeol LTD.
Model
JEM-2100F HR
Id
MTE 20
View
Q
uick
Menu
Wafer
Specification
Information
Equipment
Manual
8-inch
Equipment
Usage Fee
12-inch
Equipment
Usage Fee
Analysis/Bio/
New Material
Equipment
Usage Fee
1
2