본문 바로가기
대메뉴 바로가기
National Nanofab Center
Ministry of Science and ICT
KAIST
EMS
KR
검색어
열림버튼
통합검색
검색어를 입력해주세요
검색
전체메뉴
전체메뉴
Service
Service
National Nanofab Center
Fab Service for overseas user
Processing service
Nano·Semiconductor Processing
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Nanomaterials
Batch process
Analysis and Evaluation service
Introduction
Structural analysis
Surface/Composition analysis
Product analysis
Education service
Introduction
Training schedule
Equipment and contact
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Structural analysis
Surface/Component analysis
Product analysis
Nanomaterials
Bioanalysis
Device analysis
Usage procedures and fees
Usage procedure
FAB access guide
Usage fee
Payment of usage fee
Platform technical support
Platform technical support
National Nanofab Center
Semiconductor integrated process platform
0.18㎛ Technology
0.13㎛ Technology
Intelligent semiconductor
Nano-Bio platform
Microfluidic device·chip
MEMS in vitro diagnostic biosensor
Healthcare device
USB (User Switchable Biosensor) packaging
Next-generation sensor manufacturing platform
Thick MEMS
Thin MEMS
WLP
Material development platform
Semiconductor materials
Solid-state battery
Advanced packaging materials
Nano semiconductor convergence device platform
Display
Quantum sensor
Silicon Photonics
Technical support procedures/methods
Information
Information
National Nanofab Center
PR Center
NNFC Movies
NNFC Brochure
About NNFC
About NNFC
National Nanofab Center
Greetings
Introduction
Overview
Infrastructure
History
Organization
Organization chart
Member
Directions
Service
Fab Service for overseas user
Processing service
Nano·Semiconductor Processing
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Nanomaterials
Batch process
Analysis and Evaluation service
Introduction
Structural analysis
Surface/Composition analysis
Product analysis
Education service
Introduction
Training schedule
Equipment and contact
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Structural analysis
Surface/Component analysis
Product analysis
Nanomaterials
Bioanalysis
Device analysis
Usage procedures and fees
Usage procedure
FAB access guide
Usage fee
Payment of usage fee
Platform technical support
Semiconductor integrated process platform
0.18㎛ Technology
0.13㎛ Technology
Intelligent semiconductor
Nano-Bio platform
Microfluidic device·chip
MEMS in vitro diagnostic biosensor
Healthcare device
USB (User Switchable Biosensor) packaging
Next-generation sensor manufacturing platform
Thick MEMS
Thin MEMS
WLP
Material development platform
Semiconductor materials
Solid-state battery
Advanced packaging materials
Nano semiconductor convergence device platform
Display
Quantum sensor
Silicon Photonics
Technical support procedures/methods
Information
PR Center
NNFC Movies
NNFC Brochure
About NNFC
Greetings
Introduction
Overview
Infrastructure
History
Organization
Organization chart
Member
Directions
닫기
national nanofab center
Service
HOME
Service
Service
Platform technical support
Information
About NNFC
Homepage Guide
Processing service
Fab Service for overseas user
Processing service
Analysis and Evaluation service
Education service
Equipment and contact
Usage procedures and fees
Nanomaterials
Nano·Semiconductor Processing
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Nanomaterials
Batch process
SNS공유
닫기
페이스북
트위터
블로그
복사하기
프린트
Nanomaterials
Home
Service
Processing service
Nanomaterials
SNS공유
닫기
페이스북
트위터
블로그
네이버 밴드
카카오스토리
카카오톡
복사하기
프린트
ALL
Photo
Etch
Thin Film
Diffusion
In-line Measurements
Packaging
Simulation
Nanomaterials
Module Process
게시물 검색
ALL
게시물 검색
Total
0
(Page
1
/1)
Data is currently being prepared.
We are preparing to provide better services.
We will prepare and visit you as soon as possible.