본문 바로가기 대메뉴 바로가기

National Nanofab Center

national nanofab center

Product analysis

게시물 검색
게시물 검색
Total 13 (Page 1/2)
주사탐침현미경
Structural analysis
Scanning Probe Microscopy
  • 작성일시2024-04-19 07:58:29
  • 조회수47
집속이온빔시스템
Structural analysis
Focused Ion Beam system
  • 작성일시2024-04-18 17:44:36
  • 조회수63
투과전자현미경
Structural analysis
Microstructure Analysis Crystal Structure Analysis Composition Analysis Real-time Observation
Transmission electron microscope
  • 작성일시2024-04-18 16:54:04
  • 조회수101
제품구조분석, 불량분석
Product analysis
Device Structural AnalysisFailure AnalysisReverse Engineering
Product Structure Analysis, Defect Analysis
  • 작성일시2024-03-06 14:42:13
  • 조회수63
나노압입 시험 분석
Surface/Component analysis
Nanoindentation Test
Nanoindentation Test
  • 작성일시2024-03-06 14:39:40
  • 조회수44
푸리에 변환형 적외선 분광 분석
Surface/Component analysis
Fourier Transform Infrared Spectroscopy
Fourier Transform Infrared Spectroscopy
  • 작성일시2024-03-06 14:38:03
  • 조회수39
라만 분광 분석
Surface/Component analysis
RamanSpectroscopy
Raman Spectroscopy
  • 작성일시2024-03-06 14:32:21
  • 조회수30
비행시간형 이차이온 질량분석
Surface/Component analysis
Time of FlightSecondary IonMass Spectrometry
Time of FlightSecondary IonMass Spectrometry
  • 작성일시2024-03-06 14:25:30
  • 조회수46
엑스선 회절분석기
Surface/Component analysis
Xray Diffractometer
X-ray diffractometer
  • 작성일시2024-03-06 14:22:40
  • 조회수66
엑스선 광전자분광기
Surface/Component analysis
Multi-functionalXrayPhotoelectron Spectroscopy
Multi-functional Xray Photoelectron Spectroscopy
  • 작성일시2024-03-06 14:21:22
  • 조회수46
엑스선 광전자분광기
Surface/Component analysis
XrayPhotoelectron Spectroscopy
Xray Photoelectron Spectroscopy
  • 작성일시2024-03-06 14:05:01
  • 조회수63
자기섹터형 이차이온 질량분석
Surface/Component analysis
Magnetic SectorSecondary IonMass Spectrometry
Magnetic Sector Secondary Ion Mass Spectrometry
  • 작성일시2024-03-06 11:49:50
  • 조회수55